NIR Spectral Analyzer A8850 (for solids and powders)
Overview
This Near Infrared (NIR) spectral analyzer was developed based on our over 40 years of accumulated sales experience. It provides the features required for laboratory analysis and has been perfected with our proprietary technology. Various features, such as the sampling system that meets the diverse demands of measurement in laboratories, deliver excellent cost performance and top-class capabilities.The wide-scan monochromator with its large diffraction grating enables high-quality spectroscopic measurements in the wavelength range of 400-2500 nm. In addition, the sample box is equipped with an XY-movable multi-purpose stage for flexible measurement methods linked to the spectroscopic measurements.
Feature
High performance, high instrument compatibility and multi-purpose applications
Spot size adjustment mechanism
The optimal spot size (area of incident light) can be adjusted to match the measurement method.
Grating optimization control
Round-trip scanning is adopted to achieve a high scanning speed of 2 scan/second.
Large diffraction grating
Use of a large diffraction grating delivers high quality spectra with low noise.
Instrument calibration function
Comes equipped with a calibration function using the NIST standard.
High compatibility between instruments
Delivers high compatibility between instruments.The developed calibration curves can be used in the same model with minimal corrections.
Wide-scan monochromator
We have developed a monochromator that separates out a wide range of wavelengths, from 400 nm in the visible range to 2500 nm in the near infrared.
Independently-developed product
We design, develop, and manufacture all our products in Japan, so you can use them with confidence under our comprehensive customer support system.
Detector placement optimized for wide-area measurements
A total of 8 Si (silicon) and PbS (lead sulfide) elements are arranged along a circumference. A wide range of diffuse reflected light can be reliably detected.
Stage for multi-purpose measurements
You can use the XY stage in an infinite number of ways, limited only by your imagination. Standard usage is provided.
Specification
| Wavelength range | 400-2500nm |
|---|---|
| Photometric range | 2.0AU |
| Noise（RMS）at 0 Abs | 400-700nm ＜50μAbs 700-2500nm ＜30μAbs |
| Data interval | 0.5nm |
| Scanning speed | 2 Scan/ Second |
| Detector | 400-1100nm Si（silicon） 1100-2500nm PbS（lead sulfide） |
| Power input | Single phase AC 90V-264V 50/60Hz |
| Power consumption | Maximum 200W |
| Main unit dimensions | Width 410mm × Height 400mm × Depth 620mm |
Contact Us
Please use this form to submit your inquiries, feedback and/or requests to NIRECO.
